Nanoscale chemical identification and mapping of materials now becomes possible with Nano-FTIR (Neaspec GmbH, Germany). This technique combines Atomic Force Microscopy AFM, operated in tapping mode, and Fourier transforms infrared (FTIR) spectroscopy. Nano-FTIR allows for fast and reliable chemical identification of virtually any material at the nanometer scale.
Main Specifications of Nano-FTIR (s-SNOM)
- 20 nm optical resolution
- Near Field Spectroscopy
- High speed near field imaging
- Simultaneous optical amplitude (reflection)
- Phase (absorption) measurement
- 3-20 μm spectral range
Nanoscale chemical identification with high-sensitivity. FTIR allows for fast and reliable chemical identification of virtually any material (https://www.shimadzu.com/an/molecular_spectro/ftir/irtracer/irtracer_2.html).
Main Specifications FTIR
- 7,800 to 350 cm-1 spectral range
- Michelson interferometer
- S/N 60.000:1
- Pellet, Powder, Liquid Samples and Thin Films can be measured.
-ATR- measure the spectrum of a liquid and solid samples by simply clamping them onto the surface of the prism using the provided pressure clamp .
-RAS- high-sensitivity reflection measurement accessory, featuring incidence angle of 70° a, for the analysis of thin films on a metal plate with a nm order of thickness.
-SRM-specular reflectance accessory, featuring a 10° incidence angle, for the analysis of thin films on a metal plate with a µm order of thickness.
The system can handle measurement with highly precise transmittance and reflectance, and uses three detectors
to handle a range going from the ultraviolet region to the near-infrared region (https://www.shimadzu.com/an/molecular_spectro/uv/uv-3600plus.html).
- 185 to 3,300 nm wavelength range
- 0.1 nm resolution
- -6 to 6 Abs photometric range